by National Aeronautics and Space Administration, Scientific and Technical Information Branch, For sale by the National Technical Information Service] in Washington, D.C, [Springfield, Va .
Written in English
|Statement||Walton L. Howes.|
|Series||NASA technical paper -- 2060.|
|Contributions||United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch.|
|The Physical Object|
|Pagination||17 p. :|
|Number of Pages||17|
A large-aperture interferometer has been devised by adding a local reference-beam-generating interferometer to a schlieren system. Two versions of the interferometer were demonstrated, one employing cm diam schlieren optics, the other employing cm diam parabolic mirrors in an off-axis system. In the latter configuration, a cylindrical lens was introduced near the light . a method for producing very large aperture interfm' ometers, with small beam dividers, that do not require reference standards. One example of a large field (or aperture) inter ferometer for wind tunnel work is that described by Williams (4J. The beam divider of this instrument is a modified Kastel'S double-image prism. This. Large-aperture, equal-path interferometer for precision measurements of flat transparent surfaces Article (PDF Available) in Applied Optics 53(8) March with Reads. The measurement of flat optical components often presents difficulties because the presence of parallel surfaces generates multiple reflections that confuse conventional laser-based interferometers. These same parts have increasingly demanding surface finish tolerances as technologies improve over time, further complicating the metrology task. Here we describe an .
Various reflective surfaces are used for reference planes in precision systems, such as a moving mirror of a high precision X-Y stage using a laser interferometer, a reflective mirror of X-ray optics, and a reference plane for a large-aperture interferometer,,,. Since accuracy of surface profile affects overall performance of the systems Cited by: 4. Applications of Holography and Optical Data Processing contains the proceedings of the International Conference on Applications of Holography and Optical Data Processing, held in Jerusalem in August The conference is attended by eminent scientists in the field of optics, characterized by high-level scientific presentations and discussions. Interferometry (in this case “astronomical interferometry”) is a technique that astronomers use to obtain the resolution of a large telescope by using multiple smaller telescopes. The electromagnetic radiation collected at each of a number of separate small telescopes is combined to re-create the image that would have been obtained with the. perform measurements using a rough reference surface. This technique has been successfully demonstrated at the University of Erlangen where an aluminum casting about mm wide was measured with scanning white-light interferometry using LED arrays for the illumination. Figure 3 at right shows the measured height map. 6. Concluding remarks.
One of our recent works presented in this paper is to develop a near infrared ( nm) large aperture (24 inches) interferometer which is the first NIR large aperture interferometer in China. It can be used to test the optical element with large aperture, including surface flatness, refractive index homogeneity, : Zhu Rihong, Chen Lei, Gao Zhishan, He Yong, Wang Qing, Guo Renhui, Li Jianxin, Deng Shaogeng, Ma Jun. Typical Interferometer Setups This page explains some of the interferometric measurement techniques commonly used in the optics industry. For more detailed information on these setups, and many more, you may download a copy of ZYGO's Guide to Typical Interferometer Setups. This paper puts forward a new large-aperture high-accuracy interferometer for flow visualization and optical shop testing. The interferometer uses a Twyman-Green interferometer as a beam splitter, and a grating as a detector. Using this interferometer to measure the flow fields in a shock tunnel and to test optical elements obtained some Author: Anzhi He, Hai-Ling Wang, Peng Cheng Miao, Dapeng Yan. Original Press Release: Zygo Releases Verfire(TM) Xl Interferometer for Large Aperture Form Metrology Middlefield CT – Zygo Corporation announces the release of the Verifire™ XL high-precision Fizeau interferometer for the simple and accurate characterization of flat surfaces up to 12 inches ( mm) in diameter.